Package: ATmet
Type: Package
Title: Advanced Tools for Metrology
Version: 1.2
Date: 2014-01-06
Author: S.Demeyer, A.Allard
Maintainer: Alexandre Allard <alexandre.allard@lne.fr>
Depends: R (>= 2.7.0), DiceDesign, lhs, metRology, msm, sensitivity
Description: This package provides functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.
License: GPL-3
Packaged: 2014-04-17 09:21:13 UTC; ALLARD
NeedsCompilation: no
Repository: CRAN
Date/Publication: 2014-04-17 19:04:39
● Data Source:
CranContrib
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0 images,
4 functions,
0 datasets
●
Reverse Depends: 0
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